Surface Analysis
WEL 3.218, 471-58460
The Surface Analysis Laboratory is responsible for various surface analysis measurements and consists of three chambers from Physical Electronics. It contains a Physical Electronics 5700 Electron Spectroscopy Chemical Analysis (ESCA) System, a Physical Electronics 7200 Time Of Flight (TOF)/ Secondary Ion Mass Spectroscopy (SIMS) System and a Physical Electronics 590 Scanning Auger Microprobe (SAM). The ESCA system is used primarily to investigate surface chemical compositions. ESCA allows for in depth analysis of the first few atomic layers of a prepared sample. The TOF SIMS system is used for molecular surface analysis and investigation of a variety of samples, including polymers, thin films, and semiconductor materials. The SAM System is capable of scanning the electron beam, which makes it possible not only to do elemental analysis (like with the ESCA), but also chemical, secondary electron emission and absorption mapping. Also located in the Surface Analysis Laboratory is the Atomic Force Microscope (AFM) used to do quantitative measurements of nanomechanical properties of model composite interphases.
